NAND Flash Programming on your TS12x or GR228x
In spite of what Wikipedia says, http://en.wikipedia.org/wiki/Bed_of_nails_tester,
your TS12x and GR228X is capable of testing and programming NAND flash.
Now
is the time to get that expensive NAND Flash Programming Station off your
floor! Consolidate your process, save time and money on every piece you build!
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Specifications
·
First working model programs Micron, 2 G-bit
parts that are 8-bits wide.
·
The detection, marking and mapping of bad
blocks is fully supported.
·
Programming rate of 176 milliseconds per
block or faster. One block = 135168
bytes.
·
Data transfer rate from tester to the DUT is
1 byte every 250 nanoseconds.
·
Factory marked bad blocks are identified and
mapped around.
·
Any single-bit mis-compare will mark a new
bad block on the fly.
·
ECC
data can be programmed and verified, but the tester cannot do on-the-fly error
correction. This is the only limitation.
·
A
C++ DOS console program will convert your binary image to a DDS file. Each
block has a separate dataset.
·
The test program will facilitate the manual
marking or unmarking of bad blocks.
·
The successful use of any ISP model is
contingent on good Design For Testability (DFT).
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Tester requirements:
o
GR228x
is adequate. TS12x recommended and required for 1.8V devices.
o
Must
have the CST option. Two clock drivers and one trigger required per device.
o
DSM
may be adequate for smaller programming needs. DSM2 is strongly recommended.
DSM2 with 2 modules installed will program all blocks in a 2 G-bit part. Fully
loaded DSM2 will program 4 devices.
